000 00228 a2200073 4500
245 0 _aInternational Symposium on Electromagnetic Compatibility 1980 /
_c.
710 2 _aIEEE.
_eWydawca
_4pbl
260 _aNew York, NY :
_bIEEE,
_c1980.
300 _a407 s.;
_c35 cm.
999 _c6771
_d6771