000 00233 a2200073 4500
245 0 _aInternational Symposium on Electromagnetic Compatibility /
_c.
710 2 _aIEEE.
_eWydawca
_4pbl
260 _aNew York, NY :
_bIEEE,
_c1986.
300 _aX, 524 s.:
_bil.;
_c28 cm.
999 _c6769
_d6769