000 00268 a2200073 4500
245 0 _aConference on Electronic Test and Measuring Instrumentation TESTMEX 79 /
_c.
710 2 _aInstitution of Electrical Engineering.
_eWydawca
_4pbl
260 _aLondon :
_bIEE,
_c1979.
300 _aVII, 157 s.;
_c35 cm.
999 _c4441
_d4441