Montrose, Mark I..  <br/><br/>
Testing for EMC Compliance :   Approaches and Techniques /  
Montrose Mark I., Nakauchi Edward M.. 
 - New York ;   Piscataway, NJ :   Wiley :   IEEE,   2004. 
 - XVIII, 460 s.:   il.;   24 cm. 
<br/><br/><label>ISBN: </label>047143308X