| 000 -LEADER |
|---|
| fixed length control field |
00365 a2200109 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0471925861 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Goor, van de, A.J.. |
| Relator term |
Autor |
| 245 0# - TITLE STATEMENT |
|---|
| Title |
Testing Semiconductor Memories : |
| Remainder of title |
Theory and Practice / |
| Statement of responsibility, etc |
Goor, van de A.J.. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
New York : |
| Name of publisher, distributor, etc |
Wiley & Sons, |
| Date of publication, distribution, etc |
1991. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
XXIII, 512 s.: |
| Other physical details |
il.; |
| Dimensions |
25 cm. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
Wiley & Sons. |
| Relator term |
Wydawca |
| Relator code |
pbl |
| 920 ## - |
|---|
| -- |
0-471-92586-1 |
